Semiconductor optoelectronic devices for fibre optic system applications – Part 2: Measuring methods
standard by International Electrotechnical Commission, 01/26/2009

IEC ICC JEDEC ISPE MMPDS EEMUA
Semiconductor optoelectronic devices for fibre optic system applications – Part 2: Measuring methods
standard by International Electrotechnical Commission, 01/26/2009
Household refrigerating appliances – Characteristics and test methods – Part 3: Energy consumption and volume
standard by International Electrotechnical Commission, 02/13/2015
High frequency inductive components – Electrical characteristics and measuring methods – Part 1: Nanohenry range chip inductor
standard by International Electrotechnical Commission, 02/22/2008
Battery charging interface for small handheld multimedia devices – Part 2: 2 mm barrel type interface conformance testing
standard by International Electrotechnical Commission, 03/30/2011
Semiconductor devices – Metallization stress void test
standard by International Electrotechnical Commission, 04/22/2010
Guidelines for safety related risk assessment and risk reduction for low voltage equipment
standard by International Electrotechnical Commission, 08/30/2010
Concentrator photovoltaic (CPV) modules and assemblies – Safety qualification
standard by International Electrotechnical Commission, 09/15/2017
Automation systems in the process industry – Factory acceptance test (FAT), site acceptance test (SAT), and site integration test (SIT)
standard by International Electrotechnical Commission, 11/15/2006
Railway applications – Fixed installations – Electrical safety, earthing and the return circuit – Part 1: Protective provisions against electric shock
standard by International Electrotechnical Commission, 09/16/2013
Common control interface for networked digital audio and video products – Part 3: Video
standard by International Electrotechnical Commission, 06/05/2015