Category: IEC

Compression and mechanical connectors for power cables – Part 1-1: Test methods and requirements for compression and mechanical connectors for power cables for rated voltages up to 1 kV (U_m = 1,2 kV) tested on non-insulated conductors
standard by International Electrotechnical Commission, 05/08/2018

Optical amplifiers – Test methods – Part 3-3: Noise figure parameters – Signal power to total ASE power ratio
standard by International Electrotechnical Commission, 11/07/2013

Communication networks and systems in substations – Part 8-1: Specific Communication Service Mapping (SCSM) – Mappings to MMS (ISO 9506-1 and ISO 9506-2) and to ISO/IEC 8802-3
standard by International Electrotechnical Commission, 05/25/2004

Electrical installations for lighting and beaconing of aerodromes – Maintenance of aeronautical ground lighting constant current series circuits
standard by International Electrotechnical Commission, 03/12/2002

Electrostatics – Part 4-6: Standard test methods for specific applications – Wrist straps
standard by International Electrotechnical Commission, 01/14/2010

Application integration at electric utilities – System interfaces for distribution management – Part 8: Interfaces for customer operations
standard by International Electrotechnical Commission, 05/27/2015

Low-voltage surge protective devices – Part 32: Surge protective devices connected to the d.c. side of photovoltaic installations – Selection and application principles
standard by International Electrotechnical Commission, 09/20/2017

Functional safety – Safety instrumented systems for the process industry sector – Part 3: Guidance for the determination of the required safety integrity levels
standard by International Electrotechnical Commission, 03/18/2003

Ultrasonics – Pulse-echo scanners – Part 1: Techniques for calibrating spatial measurement systems and measurement of system point-spread function response
standard by International Electrotechnical Commission, 07/11/2006

Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
standard by International Electrotechnical Commission, 06/21/2012